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Hommel Etamic Introduces new W 600 Series Contour and Roughness Measurement System

Hommel Etamic Introduces new W 600 Series Contour and Roughness Measurement System

The new W612 measuring station features a Modular probe and system software with the capability to measure a resolution of 1nm with a TKU400 probing system. Modular design enables the upgradation of the roughness measurement system to contour measurement at any later time.  Read more